- Company : AFM Probes, Tips, And Cantilevers – TipsNano
- Region : Harjumaa , Estonia
- Category : Measurement & Analysis Instruments > Other Measuring & Analysing Instruments
- Specification : Around 30 AFM modes are realized in the basic AFM model, including: scanning tunneling microscopy and spectroscopy contact and tapping modes magnetic and electrical force microscopy lateral and adhesion force microscopy scanning capacitance and Kelvin probe spreading resistance LAO lithography and other special modes* Scanning principle: by probe Scan area: up to 40x40x5?m Noise level, XY: <0,2nm Noise level, Z: <0,002nm Sample size: 30?30?15mm Sample weight: <200g
- Quantity : 10
- Contact Person : sales Manager|||Safronova Olga
- Telephone :
- Website : http://afmnano.com/afm-handy-scan/
- Email : [email protected]
- Update : Sep/10/2017
Product Details
Advantages of HandyScan: Easy to use Lower price as compared to most existing AFM systems – starting from 31 000€ Self-installed (easy to install, detailed user guides allow to assemble and run the system without manufacturer’s specialists) Possibility to achieve atomic resolution once the system installed HandyScan is equipped with powerful software for image acquisition and processing
